Microstructure Analysis of Nanocrystalline Powders by X-ray Diffraction

Surface Hardness Measurment and Microstructural Characterisation of Steel by X-Ray Diffraction Profile Analysis

An X-ray diffraction line will broaden considerably when steels change into martensitic structure on quenching. The results presented in this paper show that X-ray diffraction technique can be employed for a rapid and nondestructive measurement of hardness of hardened steel. Measurement on various quenched and tempered steels showed that the breadth of its diffraction peak increased with increa...

Quantitative Analysis by X-ray Diffraction

Certain minerals in soil clays may be directly estimated from diffraction line intensity and the mass absorption coefficient of the sample to the radiation used. The main advantages of the method described are that no internal standards or calibration charts are required, and any diffraction line of the component to be estimated may be chosen. The results obtained compare favourably with chemic...

X-ray diffraction peak profile analysis of maraged Fe-Ni-Mn steels

X-ray diffraction peak profile analysis was used to identify changes in the lattice distortions during isothermal aging of Fe-10Ni-7Mn (wt. %) maraging steel. Integral peak breadths were analyzed using classical Williamson-Hall equation taking the elastic anisotropy into account. It was found that substantial lattice distortions rise during precipitation hardening which depend strongly on the s...

Probing Microstructure Dynamics With X-Ray Diffraction Microscopy

We describe our recent work on developing X-ray diffraction microscopy as a tool for studying three dimensional microstructure dynamics. This is a measurement technique that is demanding of experimental hardware and presents a challenging computational problem to reconstruct the sample microstructure. A dedicated apparatus exists at beamline 1-ID of the Advanced Photon Source for performing the...

Structure of nanocrystalline MgFe2O4 from X-ray diffraction, Rietveld and atomic pair distribution function analysis